The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 28, 2006
Filed:
Jun. 04, 2002
Thomas J. Sebok, Tallmadge, OH (US);
Dale R. Sebok, Tallmadge, OH (US);
Joseph P. Kolp, North Canton, OH (US);
Thomas J. Sebok, Tallmadge, OH (US);
Dale R. Sebok, Tallmadge, OH (US);
Joseph P. Kolp, North Canton, OH (US);
Lockheed Martin Corporation, Akron, OH (US);
Abstract
A tribological debris analysis system includes a general purpose computer; and a tribological sensor system for generating data. The sensor system includes an optical flow cell a pump for pumping a fluid through the optical flow cell, a laser for illuminating the fluid flowing through the optical flow cell, and an imaging device for detecting any debris in the fluid illuminated by the laser. The imaging device sends the object information—in either the form of object elements or objection segments—representative of the debris to the general purpose computer for analysis. The general purpose computer classifies the debris according to size, any trends associated with the size of the debris, generating shape features of the imaged debris and identifying a type of object wear based upon the shape features.