The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 28, 2006
Filed:
Mar. 20, 2003
Dietrich W. Vook, Los Altos, CA (US);
Izhak Baharav, San Jose, CA (US);
Xuemei Zhang, Mountain View, CA (US);
Ramakrishna Kakarala, Santa Clara, CA (US);
Richard L. Baer, Los Altos, CA (US);
Dietrich W. Vook, Los Altos, CA (US);
Izhak Baharav, San Jose, CA (US);
Xuemei Zhang, Mountain View, CA (US);
Ramakrishna Kakarala, Santa Clara, CA (US);
Richard L. Baer, Los Altos, CA (US);
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
A three-dimensional optical inspection system reconstructs a three-dimensional image of the shape of the surface of an at least partially specular object resident on a printed circuit board by capturing two or more two-dimensional images of the object under different illumination configurations. The diffuse reflection, as well as the specular reflection can be used to reconstruct the three-dimensional image using any reconstruction method, such as photometric stereo. The different illumination configurations can be achieved using an illumination source including light-emitting elements arranged in concentric circular arrays, in which each of the circular arrays is divided into sections. Each section is independently controlled to selectively activate the sections to illuminate the object in a pre-established illumination pattern.