The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2006

Filed:

Oct. 30, 2002
Applicants:

Mark Hereld, Chicago, IL (US);

Ivan R. Judson, Chicago, IL (US);

Rick L. Stevens, Naperville, IL (US);

Inventors:

Mark Hereld, Chicago, IL (US);

Ivan R. Judson, Chicago, IL (US);

Rick L. Stevens, Naperville, IL (US);

Assignee:

The University of Chicago, Chicago, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G09G 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image pattern description is stored and tiled display test pattern images are captured. The stored image pattern description and at least one captured tiled display test pattern image are used to identify a tile array placement and layout; a tile registration measurement; and a dot grid measurement providing measured dot grid positions. At least one captured tiled display test pattern images and the measured dot grid positions are used for calculating tile-to-camera maps and a camera-to-mural map. The tile-to-camera maps and the camera-to-mural map are used to generate control and correction data.


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