The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2006

Filed:

Mar. 31, 2004
Applicant:

Lysander Lim, Austin, TX (US);

Inventor:

Lysander Lim, Austin, TX (US);

Assignee:

Silicon Laboratories, Inc., Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03L 7/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

A dual path frequency synthesizer is disclosed which includes a controlled oscillator and a phase detector that determines the phase difference between an output signal of the controlled oscillator and a reference signal. The synthesizer also includes a charge pump that is coupled to the phase detector. The synthesizer includes a direct path loop filter which is coupled to a charge pump output. The synthesizer also includes an integrating path loop filter which is coupled to another charge pump output and which has substantially the same topology as the direct path loop filter. The direct path loop filter and the integrating path loop filter are substantially matched with one another. The charge pump pumps charge into the direct and integrating path loop filters in response to the phase difference between the reference signal and the output signal of the controlled oscillator as determined by the phase detector. The controlled oscillator is effectively decoupled from the direct and integrating path loop filters at those times when the charge pump is pumping charge into the filters. This reduces the impact of signals from the charge pump that might otherwise cause degradation in the performance of the controlled oscillator and spurious radiation.


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