The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 28, 2006
Filed:
Jan. 03, 2005
Keith F. Anderson, Santa Rosa, CA (US);
David V. Blackham, Santa Rosa, CA (US);
Brad R. Hokkanen, Windsor, CA (US);
Kenneth H. Wong, Santa Rosa, CA (US);
Keith F. Anderson, Santa Rosa, CA (US);
David V. Blackham, Santa Rosa, CA (US);
Brad R. Hokkanen, Windsor, CA (US);
Kenneth H. Wong, Santa Rosa, CA (US);
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
In one embodiment, a method of calibrating a multi-port vector network analyzer (VNA) includes (i) performing two-port calibrations on pairs of ports to determine forward and reverse systematic error terms associated with each pair of ports, wherein the pairs of ports are selected such that each port's systematic error terms (directivity, source match, reflection tracking, and load match) are determined, (ii) generating a switch error correction matrix using data from the two-port calibrations, and (iii) performing unknown thru calibration for at least one pair of ports that was not utilized in step (i), wherein the unknown thru calibration comprises applying the switch error correction matrix to measurement data and determining transmission tracking error terms using the corrected measurement data.