The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2006

Filed:

Sep. 03, 2004
Applicants:

James T. Walker, Palo Alto, CA (US);

Christopher I. Walker, Pasadena, CA (US);

Inventors:

James T. Walker, Palo Alto, CA (US);

Christopher I. Walker, Pasadena, CA (US);

Assignee:

Amfit, Inc., Vancouver, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system for electrostatically measuring the shape or pattern of objects including an array of sensor devices having the capability of responding, due to variable electrostatic coupling, to produce differentiated output signals when a sensor element forming part of each device is present and when it is not.


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