The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7018093 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 28, 2006

Filed:

Jul. 10, 2002
Applicants:

Ki-hwan Park, Suwon, KR;

Jong-sub Hwang, Suwon, KR;

Jeong-hwan Kim, Seoul, KR;

Inventors:

Ki-Hwan Park, Suwon, KR;

Jong-Sub Hwang, Suwon, KR;

Jeong-Hwan Kim, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01K 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a temperature controlling apparatus for controlling temperature by using a temperature sensor, a defect state of the temperature sensor is sensed by sensing a change of specific resistance of the temperature sensor. A temperature value of the temperature sensor is detected at each unit time during exchanging of a chemical solution or stopping of a process in a chamber of the semiconductor fabricating process. A lowest temperature among the detected temperature values and a reference temperature predetermined to sense the change of the specific resistance of the temperature sensor, are compared with each other. When the lowest temperature deviates from the reference temperature, a defect of the temperature sensor is confirmed and a message indicative of a defect state and an alarm are generated.


Find Patent Forward Citations

Park, Ki-Hwan. (2006). Apparatus and method for sensing defects in temperature sensors (U.S. Patent No. 7018093). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7018093

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