The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 21, 2006
Filed:
Oct. 25, 2001
Jack Edward Mott, Idaho Falls, ID (US);
Jack Edward Mott, Idaho Falls, ID (US);
Triant Technologies Inc., Nanaimo, CA;
Abstract
A reference matrix contains valid measurements characterizing operation of a multivariate process (). Modeling parameters of the reference matrix are derived (). The final model parameters, balanced with respect to measuring and modeling uncertainties (), are applied to model () a new set of measurements (). If the new set has no faults () then all modeled values and modeling uncertainties () can be used to control the process (). If the new set has only one fault () ten the modeled value and modeling uncertainty of the faulted measurement plus the measured values and measuring uncertainties of the unfaulted measurements () can be used to control the process () while repair procedures are implemented for the identified fault (). If the new set has more than one fault () then the process () should be shut down, and repair procedures should be implemented () for all identified faults.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile