The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 21, 2006
Filed:
Jun. 02, 2003
Bakul Damle, Frisco, TX (US);
Christopher G. Regier, Cedar Park, TX (US);
Scott Borisch, Austin, TX (US);
Bakul Damle, Frisco, TX (US);
Christopher G. Regier, Cedar Park, TX (US);
Scott Borisch, Austin, TX (US);
National Instruments Corporation, Austin, TX (US);
Abstract
A small microcontroller or a DSP may be used to process digital signals representative of a measurement. Furthermore, special RMS AC measurement or DC noise rejection algorithms may have to be run on the microcontroller or the DSP. Other implementations may use custom digital logic, such as FPGAs, to process the digital signals. The DSP may not have enough capacity to store and process all data at the same time. Certain physical limitations are inherent to the DSP architectures, such as the trade-off of on-board memory size vs. speed, power consumption, and physical chip size. As a result, the RMS AC Measurement and the DC Noise rejection algorithms enable computational devices such as DSP's to perform sophisticated and accurate RMS measurements for waveforms ranging from DC to high frequency. The RMS AC Measurement and the DC Noise rejection algorithms uses on the on-the-fly computation of interpolated window values. As a result, the RMS AC Measurement and the DC Noise rejection algorithms can use any window, rather than being constrained to computationally efficient sincwindows.