The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 21, 2006

Filed:

Jun. 18, 2004
Applicants:

Gerardo Rinaldi, Milan, IT;

Venturino Gianfranco, Milan, IT;

Giuseppe Rotondo, Milan, IT;

Inventors:

Gerardo Rinaldi, Milan, IT;

Venturino Gianfranco, Milan, IT;

Giuseppe Rotondo, Milan, IT;

Assignee:

Gendex Corporation, Washington, DC (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H05G 1/64 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus and method used in intra-oral dental x-ray imaging equipment provides automatic detection of the x-ray emission in order to obtain timely transition to the image integration and acquisition phase with high level of rejection of false triggering induced by blemish defects of the image sensor or by variations of the ambient and temperature conditions. A solid state imager, such as a CCD image sensor, is continually clocked during the standby phase prior to irradiation from an X-ray source, so providing on same time an output signal proportional to the accumulated dark current and the continuous removal of the same. A control unit analyses the output signal of the imager, detects the variation caused by the start of the x-ray emission using appropriate threshold levels, and automatically triggers the imager to the image integration and acquisition phases. Based on memorised maps of the imager blemish defects, and continually monitored variations of the imager output signal, the control unit will reject false triggering due to imager defects or variations of the ambient and temperature conditions.


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