The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 21, 2006

Filed:

Oct. 15, 2002
Applicants:

Takashi Nakano, Ibaraki, JP;

Hisako Fukuda, Ibaraki, JP;

Junji Tominaga, Ibaraki, JP;

Nobufumi Atoda, Ibaraki, JP;

Takashi Kikukawa, Tokyo, JP;

Inventors:

Takashi Nakano, Ibaraki, JP;

Hisako Fukuda, Ibaraki, JP;

Junji Tominaga, Ibaraki, JP;

Nobufumi Atoda, Ibaraki, JP;

Takashi Kikukawa, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In an optical information medium comprising an information recording layer having a mark train of marks and spaces, the mark train is read out by scanning it with a laser beam and detecting a light intensity change pattern of reflected laser beam. Provided that the reflected laser beam includes polarized light components which define an angle θ with the mark train, a polarized light component giving θ=0 is xcomponent, and a polarized light component giving θ=90° is ycomponent, the mark train is read out utilizing at least a light intensity change of xcomponent. When pits or recorded marks having a size approximate to or below the resolution limit are read out, the present invention allows high read outputs to be obtained and prevents omission of readout signals.


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