The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 21, 2006
Filed:
Dec. 30, 2004
Takeshi Mochizuki, Ibaraki, JP;
Susumu Tateyama, Ibaraki, JP;
Kazutaka Setoma, Ibaraki, JP;
Ricoh Printing Systems, Ltd., Tokyo, JP;
Abstract
In an optical scanning apparatus, a light beam emitted from a light source is deflected and scanned by a light deflecting member, and then scanned and imaged with substantial speed uniformity onto a medium to be scanned by a scanning optical element. The apparatus is configured so that, when the angle formed by the light beam that is deflected and scanned and the optical axis of the scanning optical element is θ, the amount of positional deviation due to deviation from speed uniformity of the light beam on the medium to be scanned is ε(θ), the spatial scan density on the medium to be scanned is P, and the maximum of an absolute value of the angle θ is θo, an expression of |dε(θ)/dθ|≦5.0×10/Pθo holds.