The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7016027 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 21, 2006

Filed:

May. 08, 2003
Applicants:

Shahid Butt, Ossining, NY (US);

Shoaib Zaidi, Poughkeepsie, NY (US);

Inventors:

Shahid Butt, Ossining, NY (US);

Shoaib Zaidi, Poughkeepsie, NY (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system for detecting the quality of an alternating phase shift mask having a number of 180-degree phase shift areas alternating with a number of 0-degree phase shift areas is disclosed. In operation, a light source which provides wavelength-adjustable incident lights illuminates the incident lights on the alternating phase shift mask. The light outputs from boundaries between the 0-degree phase shift areas and the 180-degree phase shift areas of the alternating phase shift mask are detected. Relation curves of the wavelength of the incident light and a light intensity of the boundaries are then calculated. Phase errors of the alternating phase shift mask can thus be measured from the relation curves.


Find Patent Forward Citations

Butt, Shahid. (2006). System and method for quantifying errors in an alternating phase shift mask (U.S. Patent No. 7016027). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7016027

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