The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 21, 2006
Filed:
Dec. 18, 2003
Joachim Peerlings, Stuttgart, DE;
Joachim Peerlings, Stuttgart, DE;
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
The present invention relates to a method and to an apparatus for measuring an optical property, such as group delay or chromatic dispersion, of a DUT, comprising: a first coupler connected to the DUT for coupling a first optical signal having a first wavelength and a second optical signal having a second wavelength into the DUT, the second wavelength being variable with respect to the first wavelength, a detector connected to the DUT for detecting the first and the second signal leaving the DUT, an evaluation unit connected to the detector, for determining a difference in runtime, if any, between the first and the second signal having traveled at least one time through the DUT and for deriving the optical property from the detected difference.