The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 21, 2006

Filed:

Jan. 12, 2005
Applicants:

Sandeep Kumar Gupta, Santa Clara, CA (US);

Oleksiy Zabroda, San Jose, CA (US);

Inventors:

Sandeep Kumar Gupta, Santa Clara, CA (US);

Oleksiy Zabroda, San Jose, CA (US);

Assignee:

Teranetics, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A high-speed sampling system and an analog to digital converter are disclosed. One embodiment of a method of sampling a signal includes receiving an analog signal and generating first samples at a rate of Fs, and generating second sub-samples from the first samples at a rate of Fs/N and having a relative phase of approximately (360/N)*(i−1) degrees, where i varies from 1 to N. In a first embodiment, at most two second sub-samplers are tracking the output of the first sampler at any point in time. In a second embodiment, only one of the N second sub-samplers are tracking the output of the first sampler at any point in time. A third embodiment further includes generating third samples from the second samples at a rate of Fs/N, and having a relative phase of approximately ((360/N)*(i−1)+180) degrees. A method of interleaved analog to digital converting includes corresponding time interleaved ADCs receiving the third samples.


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