The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 21, 2006
Filed:
Dec. 26, 2001
Applicants:
Hidetoshi Konno, Tokyo, JP;
Yasuyuki Moriyama, Tokyo, JP;
Michio Sugata, Tokyo, JP;
Inventors:
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
Flaw detection apparatus includes an electrode disposed in a region surrounded by a packaging material including a layer of an electrically-conductive material; a cutting member made of an electrically-conductive material and adapted to cut a predetermined portion of the packaging material; a variable detector, disposed between the electrode and the cutting member, for detecting an electrical variable; and flaw detection processor for reading the detected variable and for determining, on the basis of the detected variable, a flaw in the packaging material. In this case, the variable detector is disposed between the electrode and the cutting member.