The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 21, 2006
Filed:
Mar. 22, 2005
Yoshihiro Kawano, Hachioji, JP;
Tadashi Hirata, Hachioji, JP;
Tatsuo Nakata, Hino, JP;
Yoshihisa Tanikawa, Chuo-ku, JP;
Yoshihiro Kawano, Hachioji, JP;
Tadashi Hirata, Hachioji, JP;
Tatsuo Nakata, Hino, JP;
Yoshihisa Tanikawa, Chuo-ku, JP;
Olympus Corporation, Tokyo, JP;
Abstract
The invention provides an optical-scanning examination apparatus with a simple configuration, in which the resolution of acquired images can be freely changed and in which the fluorescence image intensity and examination depth can be adjusted to suit the purpose of examination. The optical-scanning examination apparatus includes a light source unit; a focusing lens for forming a first intermediate image of excitation light; an imaging lens; a first objective lens; an optical fiber bundle; a second objective lens; and an imaging unit for imaging return light that returns via the second objective lens, the optical fiber bundle, the first objective lens, and the imaging lens. In addition, a scanning mirror device, which is disposed at the first intermediate image position, is formed of a plurality of mirrors that simultaneously receive the first intermediate image and that can be selectively turned on and off.