The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 14, 2006
Filed:
Nov. 13, 2003
Kenneth H. Wong, Santa Rosa, CA (US);
James C. Liu, Santa Rosa, CA (US);
Johan J. Ericsson, Windsor, CA (US);
Kenneth H. Wong, Santa Rosa, CA (US);
James C. Liu, Santa Rosa, CA (US);
Johan J. Ericsson, Windsor, CA (US);
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
Calibration is performed for the testing of a device under test. A first port of the device under test is connected to a port of a calibration module. A second port of the device under test is connected to a first port of a device tester. A third port of the device under test is connected to a second port of a device tester. The device tester performs measurements by the device tester to obtain calibration parameters. In response to commands from the device tester, the calibration module changes termination values at the port of the calibration module. The changing of the termination values is performed without physical disconnection of the port of the calibration module from the first port of the device under test.