The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 14, 2006
Filed:
Jul. 15, 2002
Edward David Landry, Waterford, NY (US);
James Elmer Leonard, San Jose, CA (US);
Randy Raymond Stark, Morgan Hill, CA (US);
Ronald Martin Horn, Palo Alto, CA (US);
Edward David Landry, Waterford, NY (US);
James Elmer Leonard, San Jose, CA (US);
Randy Raymond Stark, Morgan Hill, CA (US);
Ronald Martin Horn, Palo Alto, CA (US);
General Electric Company, Schenectady, NY (US);
Abstract
The method includes receiving parameters input by a user and calculating crack behavior estimations based on the received parameters by using a plurality of accessible crack behavior models. The crack behavior estimations calculated from each of the models are displayed to the user in order to illustrate how the different models compare in calculating a desired crack behavior profile. The displayed crack behavior estimations utilize a compilation of both historical crack growth rate data, as well as predicted crack growth rate data, and may be displayed as an estimated crack growth rate versus time, or as estimated crack growth over time. These parameters are displayed graphically for each crack behavior model in order to enable the user to make a comparison for each crack growth model.