The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 14, 2006
Filed:
Jun. 28, 2001
Darren Schmidt, Cedar Park, TX (US);
Ram Rajagopal, Austin, TX (US);
Lothar Wenzel, Round Rock, TX (US);
Dinesh Nair, Austin, TX (US);
Darren Schmidt, Cedar Park, TX (US);
Ram Rajagopal, Austin, TX (US);
Lothar Wenzel, Round Rock, TX (US);
Dinesh Nair, Austin, TX (US);
National Instruments Corporation, Austin, TX (US);
Abstract
A system and method for performing a curve fit on a plurality of data points. In an initial phase, a subset Pof the plurality of points which represents an optimal curve is determined. This phase is based on a statistical model which dictates that after trying at most Nrandom curves, each connecting a randomly selected two or more points from the input set, one of the curves will pass within a specified radius of the subset Pof the input points. The subset Pmay then be used in the second phase of the method, where a refined curve fit is made by iteratively culling outliers from the subset Pwith respect to a succession of optimal curves fit to the modified subset Pat each iteration. The refined curve fit generates a refined curve, which may be output along with a final culled subset Kof P.