The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 14, 2006
Filed:
Dec. 18, 2001
Fumiyuki Shiratani, Sagamihara, JP;
Fumiyuki Shiratani, Sagamihara, JP;
Olympus Optical Co., Ltd., Tokyo, JP;
Abstract
A 3D image acquisition apparatus comprises a pattern projection section which projects a pattern on an object to be measured, an imaging section which is disposed at a distance from the pattern projection section and images the object on which the pattern has been projected, and a depth calculation section which detects the projection pattern projected on the object on the basis of an image acquired by the imaging section, collates the detected pattern and the projected pattern, and calculates a depth of respective parts of the object on the basis of the correspondency of the collation. The projected pattern is stripes/matrix formed by alternately arranging areas with local maximum/minimum luminance values. Thus, stripes/matrix boundaries can be exactly extracted from the pattern projection image, and correct decoding is performed from the encoded projection image even where the object is not a white-based color one or a low-saturation color one.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile