The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 14, 2006
Filed:
Dec. 05, 2001
Ulf Hassler, Heilsbronn, DE;
Peter Schmitt, Erlangen, DE;
Günther Kostka, Erlangen, DE;
Abstract
In a method for characterizing a surface comprising a localized unevenness, a contour line of the surface is initially created as a function of a location variable. Subsequently, the localized unevenness is detected in the contour line and eliminated from the contour line, so that an incomplete contour line results as a function of the location variable, which characterizes the surface without the localized unevenness. The incomplete contour line may be used to either be able to evaluate the surface without any localized points of unevenness, for example to determine the side wobble or height wobble of a tire, if the surface is a side flank and/or a running tread of a vehicle tire, or to classify the localized points of unevenness without any influence of the surface.