The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 14, 2006

Filed:

Dec. 12, 2003
Applicants:

Jun Yamaguchi, Tokyo, JP;

Akihiko Hattori, Osaka, JP;

Takehiko Kitamori, Tokyo, JP;

Manabu Tokeshi, Kanagawa, JP;

Inventors:

Jun Yamaguchi, Tokyo, JP;

Akihiko Hattori, Osaka, JP;

Takehiko Kitamori, Tokyo, JP;

Manabu Tokeshi, Kanagawa, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/01 (2006.01);
U.S. Cl.
CPC ...
Abstract

It is an object to provide a photothermal conversion spectroscopic analysis method that enables measurement to be carried out with high sensitivity, and a photothermal conversion spectroscopic analysis apparatus that carries out the method. The photothermal conversion spectroscopic analysis apparatus is comprised of an exciting light source, a chopperthat is disposed close to the exciting light sourcein the optical path of exciting light emitted from the exciting light source, a mirrorthat changes the direction of travel of the exciting light, a detecting light source, a dichroic mirrorthat has detecting light from the detecting light sourceincident thereon and makes the exciting light and the detecting light coaxial, a lensthat has a suitable amount of chromatic aberration, and a holderthat holds the lenssuch as to enable adjustment along three axes.


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