The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 14, 2006
Filed:
Mar. 06, 2002
David R. Jenkins, Chapel Hill, NC (US);
David R. Jenkins, Chapel Hill, NC (US);
Radiant Imaging, Inv., Duvall, WA (US);
Abstract
A color calibration method for an imaging color measurement device utilizes a detector array, a plurality of optical elements, and multiple instances of irradiation of the detector array for a single measurement. A flat-fielding correction error correction matrix of the imaging color measurement device for each instance of irradiation of the detector array is obtained prior to color calibration. The response for each instance of irradiation of the detector array is flat-fielded with the corresponding error matrix to obtain a flat-fielded, spectrally weighted irradiance response for each instance of irradiation of the detector array. An illuminant light source with known spectral output or chromaticity coordinates is measured to obtain an irradiance response of the imaging color measurement device for each instance of irradiation of the detector array. A color correction coefficient is calculated using the known spectral output and chromaticity coordinates of the light source and the corresponding flat-fielded irradiance response.