The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7012253 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 14, 2006

Filed:

Nov. 17, 2003
Applicant:

Takayoshi Tanji, Nagoya, JP;

Inventor:

Takayoshi Tanji, Nagoya, JP;

Assignee:

Nagoya University, Nagoya, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G21K 7/00 (2006.01); G01N 23/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An electron beam is emitted from an electron beam source, and deflected at different directions with a deflection plate to form a first electron beam Eand a second electron beam EThe first electron beam Eis incident onto a given portion of a sample at an angle of θ, and the second electron beam Eis incident onto the same portion of the sample at an angle of θ. A first image and a second image of the portion of the sample by the first electron beam Eand the second electron beam Eare combined at a three-dimensional displaying device to display the portion of the sample three-dimensionally.


Find Patent Forward Citations

Tanji, Takayoshi. (2006). Transmission electron microscope and three-dimensional observing method (U.S. Patent No. 7012253). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7012253

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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