The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 14, 2006
Filed:
Feb. 11, 2003
Masahiro Shibutani, Tokyo-to, JP;
Katsuhiko Kobayashi, Tokyo-to, JP;
Gaku Takeuchi, Tokyo-to, JP;
Yumi Kubotera, Tokyo-to, JP;
Masahiro Shibutani, Tokyo-to, JP;
Katsuhiko Kobayashi, Tokyo-to, JP;
Gaku Takeuchi, Tokyo-to, JP;
Yumi Kubotera, Tokyo-to, JP;
Kabushiki Kaisha TOPCON, Tokyo-to, JP;
Abstract
An eye's optical characteristic measuring system, comprising a target projecting system for projecting a target image to an ocular fundus of an eye under test, a photodetection optical system for guiding the target image to a photoelectric detector, a simulation image calculating unit for calculating images of the target image to be formed when a plurality of target images of different sizes are independently projected to the fundus of the eye under test based on light amount intensity distribution of the target image detected at the photoelectric detector, and a visual acuity calculating unit having a predetermined threshold value and used for detecting light amount distribution characteristics from each of the light amount intensity distribution in a predetermined longitudinal direction of a plurality of target images calculated at the simulation image calculating unit and for calculating a visual acuity value of a person under test from an intersection of the light amount distribution characteristics and the threshold value.