The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 14, 2006
Filed:
Apr. 25, 2003
Matthias Meister, Celle, DE;
Jaedong Lee, Houston, TX (US);
Sven Krueger, Celle, DE;
Eick Niemeyer, Hanover, DE;
Matthias Meister, Celle, DE;
Jaedong Lee, Houston, TX (US);
Sven Krueger, Celle, DE;
Eick Niemeyer, Hanover, DE;
Baker Hughes Incorporated, Houston, TX (US);
Abstract
A method and apparatus for of determining a formation parameter of interest. The method includes placing a tool into communication with the formation to test the formation, determining a first formation characteristic during a first test portion, initiating a second test portion, the second test portion having test parameters determined at least in part by the determinations made during the first test portion, determining a second formation characteristic during the second test portion, and determining the formation parameter from one of the first formation characteristic and the second formation characteristic. The apparatus includes a draw down unit and a control system for closed loop control of the draw down unit. A microprocessor in the control system processes signals from a sensor in the draw down unit to determine formation characteristics and to determine test parameters for subsequent test portions.