The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 14, 2006
Filed:
Oct. 31, 2003
Applicants:
Giampiero Antonelli, Monza, IT;
Andreas Boegli, Vogelsang, CH;
Klaus Germerdonk, Ennetbaden, CH;
Alexander Schnell, Ennetbaden, CH;
Inventors:
Giampiero Antonelli, Monza, IT;
Andreas Boegli, Vogelsang, CH;
Klaus Germerdonk, Ennetbaden, CH;
Alexander Schnell, Ennetbaden, CH;
Assignee:
ALSTOM (Switzerland) Ltd, Baden, CH;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 19/08 (2006.01);
U.S. Cl.
CPC ...
Abstract
It is disclosed a method of detecting and quantifying subsurface defects () in an article () made of high strength non magnetisable materials after the use in a high temperature environment. A crack () or gap on a surface () of the article () is brazed and after the brazing operation the crack () or any remaining braze defect or subsurface crack () is detected and quantified by means of a multifrequency eddy current system.