The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 14, 2006

Filed:

Apr. 30, 2004
Applicant:

Robert William Bergman, Scotia, NY (US);

Inventor:

Robert William Bergman, Scotia, NY (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G10N 9/24 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method is disclosed for nondestructively examining airfoils for defects without removing them from the turbine machines of which they are a part. The method uses phased array ultrasound technology, which can be used with all types of airfoils. The angle of entry of the ultrasonic beam is varied by using phased array ultrasound technology. The phased array ultrasound allows an inspector to steer the ultrasonic beam toward an area of interest within the airfoil. The phased array allows an inspector to monitor multiple angles at once. So long as the scan angle does not exceed a calibrated range, an inspector can monitor an area of interest, no matter what the sound beam entry surface angle is. The ultrasonic beam is steered or phased to inspect different orientations with one scan. The method uses a phased array transducer that is a linear array probe that is comprised of a series of transducers. Each of these transducers is programmed to trigger at predetermined time intervals and also receive at predetermined time intervals. The signals acquired by each transducer are then processed by a computer to give a composite view of a tested region so that a defect indication can be viewed.


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