The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 07, 2006
Filed:
Jul. 22, 2003
Adam K. Kolawa, Bradbury, CA (US);
Arthur R. Hicken, Upland, CA (US);
Wendell T. Hicken, La Verne, CA (US);
Marek Kucharksi, Crakow, PL;
Adam K. Kolawa, Bradbury, CA (US);
Arthur R. Hicken, Upland, CA (US);
Wendell T. Hicken, La Verne, CA (US);
Marek Kucharksi, Crakow, PL;
Parasoft Corporation, Monrovia, CA (US);
Abstract
In one embodiment, the present invention is a method and system for testing databases and database oriented applications through analyzing database contents and structure. The method and system provide a framework for various tests, which can be deployed against the database structure or contents. The system provides a set of ready to use tests, however, custom tests can also be written using system API. Tests used within the framework constitute test suits. Test suits can be used during database oriented application development process for regression testing, verifying newly added functionality, re-testing of existing and modified functionality, deploying new versions of an application. Test suits can also be used for database monitoring and database cleaning.