The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 07, 2006
Filed:
Mar. 06, 2000
Applicant:
John C. Yundt-pacheco, Fairview, TX (US);
Inventor:
John C. Yundt-Pacheco, Fairview, TX (US);
Assignee:
Bio-Rad Laboratories, Inc., Hercules, CA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D 18/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A system for mitigating instrumentation differences in laboratory instruments includes one or more groups of laboratory instruments in communication with a normalization server over a network. Each group of instruments communicates output data to the normalization server which then presents normalized data to the groups of laboratory instruments. Various exemplary embodiments of the system and associated methods are provided.
Yundt-Pacheco, John. (2006). Method and structure for mitigating instrumentation differences (U.S. Patent No. 7010448). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7010448
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile