The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 07, 2006
Filed:
Oct. 31, 2003
Shigetsune Torin, Santa Rosa, CA (US);
Kenneth H. Wong, Santa Rosa, CA (US);
David Vernon Blackham, Santa Rosa, CA (US);
Shigetsune Torin, Santa Rosa, CA (US);
Kenneth H. Wong, Santa Rosa, CA (US);
David VerNon Blackham, Santa Rosa, CA (US);
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
Noise power is measured within one or more designated frequency bands of an applied signal. The measurement includes frequency translating the applied signal by a set of equally spaced frequencies to form a corresponding set of intermediate frequency signals, measuring the noise in at least two measurement bands of each of the intermediate frequency signals that are separated by the frequency spacing of the equally spaced frequencies, and determining the noise power in the designated frequency band of the applied signal based on the noise measurements.