The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 07, 2006
Filed:
Jan. 24, 2002
Ralf Wolleschensky, Schoeten, DE;
Bernhard Zimmermann, Potsdam, DE;
Sesbastian Tille, Pleasantville, NY (US);
Ralf Wolleschensky, Schoeten, DE;
Bernhard Zimmermann, Potsdam, DE;
Sesbastian Tille, Pleasantville, NY (US);
Carl Zeiss Jena GmbH, Jena, DE;
Abstract
A method for investigating specimens, wherein a spectral splitting of the radiation coming from the specimen is carried out for specimen points or point distributions, for the operation of a laser scanning microscope or a fluorescence screening arrangement or a flow cylinder comprising the steps of generating a λ-stack so that the spectral distribution is measured by individual detection channels and storing the signals so as to be correlated to the detection signals with at least one of the spatial coordinates x, y and z and/or so as to be correlated to the measurement time t.