The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 07, 2006
Filed:
Feb. 19, 2003
Jeffrey D. Drost, Flanders, NJ (US);
Bruce A. Pellegrino, Far Hills, NJ (US);
Jeffrey D. Drost, Flanders, NJ (US);
Bruce A. Pellegrino, Far Hills, NJ (US);
Envirosight LLC, Randolph, NJ (US);
Abstract
A process for maintaining an area using a non-invasive inspection device, the inspection device comprising at least: an imaging system having an adjustable field of view and an imaging device for transmitting an electrical signal corresponding to an area within the field of view; a portable support system operatively connected to the imaging system and adapted to provide functional support to the imaging system; and a positioning system connected to the imaging system and adapted for moving the imaging system independently of the portable support system; the process comprising: (a) positioning the imaging system independently of the support system such that a target area is in the field of view while at a first magnification level; (b) imaging a the target area at a second magnification level greater than the first magnification level; (c) outputting an image of the target area; (d) evaluating the image to determine whether the target area is acceptable or whether an invasive procedure needs to be performed; and (e) performing the invasive procedure on the target area if needed.