The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 07, 2006

Filed:

May. 28, 2004
Applicants:

Mark W. Hart, San Jose, CA (US);

Chung H. Lam, Peekskill, NY (US);

Christie R. K. Marrian, San Jose, CA (US);

Gary M. Mcclelland, Palo Alto, CA (US);

Simone Raoux, Cupertino, CA (US);

Charles T. Rettner, San Jose, CA (US);

Hemantha K. Wickramasinghe, San Jose, CA (US);

Inventors:

Mark W. Hart, San Jose, CA (US);

Chung H. Lam, Peekskill, NY (US);

Christie R. K. Marrian, San Jose, CA (US);

Gary M. McClelland, Palo Alto, CA (US);

Simone Raoux, Cupertino, CA (US);

Charles T. Rettner, San Jose, CA (US);

Hemantha K. Wickramasinghe, San Jose, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and structure for a memory cell comprising a phase change material; a heating element in thermal contact with the phase change material, wherein the heating element is adapted to induce a phase change in the phase change material; and electrical lines configured to pass current through the heating element, wherein the phase change material and the heating element are arranged in a configuration other than being electrically connected in series. The memory cell further comprises a sensing element in thermal contact with the phase change material, wherein the sensing element is adapted to detect a change in at least one physical property of the phase change material, wherein the sensing element is adapted to detect a change in a thermal conductivity of the phase change material.


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