The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 07, 2006
Filed:
Nov. 13, 2001
Xinqiao Liu, Palo Alto, CA (US);
Abbas El Gamal, Palo Alto, CA (US);
Xinqiao Liu, Palo Alto, CA (US);
Abbas El Gamal, Palo Alto, CA (US);
The Board of Trustees of the Leland Stanford Junior University, Stanford, CA (US);
Abstract
The dynamic range and the noise immunity of a digital imaging system are increased by basing an estimate of the illumination on a sensor on a series of measurements of the accumulated illumination at intervals within an exposure period. The measuring may occur destructively, or alternatively the photocurrent of the sensor may continue to accumulate over the exposure period. The estimate may use statistical signal processing of the measurements, based on various noise models and various optimization criteria. The estimate may be computed recursively over the multiplicity of measurements, using a set of recursive values that may include but is not limited to the estimated illumination, a current weighting coefficient, a variance of the current measurement and a variance over the series of measurements.