The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7009409 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 07, 2006

Filed:

Jul. 09, 2002
Applicants:

Neil R. Davie, Livingston, TX (US);

E. Michael Coffey, Kemah, TX (US);

Inventors:

Neil R. Davie, Livingston, TX (US);

E. Michael Coffey, Kemah, TX (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

A determination is made of the integrity of a gasket seal between two mating flange faces using capacitance measurement as an indication of the spacing between the flanges and thus the amount of gasket compression. The capacitance measurement can be made between a capacitor plate carried by the gasket and at least one of the flanges which serves as another capacitor plate. A capacitance-measuring instrument connected to the plates provides a measured capacitance signal that can be provided to a signal-processing instrument such as a personal computer. Further, the personal computer can be linked to a remote data center over a communications link for the transfer of gasket compression data.


Find Patent Forward Citations

Davie, Neil. (2006). Determination of gasket integrity by capacitance measurement (U.S. Patent No. 7009409). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7009409

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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