The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 07, 2006
Filed:
Apr. 21, 2003
Joseph Chung Tak Wong, Gurnee, IL (US);
Damian Neuberger, Glenview, IL (US);
Joseph Chung Tak Wong, Gurnee, IL (US);
Damian Neuberger, Glenview, IL (US);
Baxter International Inc., Deerfield, IL (US);
Abstract
The present invention provides for measuring a particle size distribution of a population of particles using a light scattering particle sizing instrument having a plurality of selectable imaginary component values of the refractive index. The particles each having a particle size and the process includes the steps of: (i) providing a population of the particles, wherein the particles have a refractive index; (ii) determining a real component of the refractive index of the particles using the Becke Line Method; (iii) determining an imaginary component of the refractive index of the particles; and (iv) determining the particle size distribution of the particles by the light scattering particle sizing instrument wherein the particle size distribution is determined using the real component of the refractive index measured in step (ii) and the imaginary component of the refractive index determined in step (iii).