The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 07, 2006

Filed:

Oct. 31, 2003
Applicants:

Lisa P. Koland, Minneapolis, MN (US);

Owen D. Grossman, Golden Valley, MN (US);

Inventors:

Lisa P. Koland, Minneapolis, MN (US);

Owen D. Grossman, Golden Valley, MN (US);

Assignee:

Honeywell International Inc., Morristown, NJ (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01M 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A high-g shock-producing device for testing a sample specimen is described which includes a beam and a shock column. The beam is of predetermined length and has at least one end substantially rigidly fixed with the specimen mounted thereon at a position remote from the one end. The shock column is positioned to apply a force causing said beam to bend in a direction transverse to the length. The column is configured to have a buckling failure when exposed to a pressure which is sufficient to bend the beam an amount to provide the desired high-g force to the specimen. The buckling failure causes the force to be suddenly removed from the beam so as to release the beam and produce the high-g shock on the specimen.


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