The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 28, 2006
Filed:
Jun. 30, 2003
Steven Michael Eustis, Essex Junction, VT (US);
Leah Marie Pfeifer Pastel, Essex, VT (US);
Thomas Richard Bednar, Essex Junction, VT (US);
Thomas Gregory Sopchak, Williston, VT (US);
Jeffery Howard Oppold, Richmond, VT (US);
Steven Michael Eustis, Essex Junction, VT (US);
Leah Marie Pfeifer Pastel, Essex, VT (US);
Thomas Richard Bednar, Essex Junction, VT (US);
Thomas Gregory Sopchak, Williston, VT (US);
Jeffery Howard Oppold, Richmond, VT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method and system for locating connector defects in a defective scan chain that has a parallel non-defective scan chain on a different wiring level, with both scan chains being laid out in a regular array pattern. A predetermined bit sequence is scanned into the defective scan chain. The contents of the defective scan chain are then parallel shifted into the non-defective scan chain. The contents of the non-defective scan chain is then scanned out and compared with the predetermined bit sequence. The comparison of the scanned out bits with the predetermined bit sequence facilitates locating both physically and logically where a connector defect has occurred in the defective scan chain.