The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2006

Filed:

Jun. 21, 2002
Applicants:

Daniel C. Zilio, Toronto, CA;

Gary G. Valentin, Toronto, CA;

Guy M. Lohman, San Jose, CA (US);

Calisto P. Zuzarte, Pickering, CA;

Roberta J. Cochrane, Los Gatos, CA (US);

Hamid Pirahesh, San Jose, CA (US);

Markos Zaharioudakis, Los Gatos, CA (US);

Kit Man Cheung, Willowdale, CA;

Kevin S. Beyer, San Jose, CA (US);

David E. Simmen, San Jose, CA (US);

Ting Y. Leung, San Jose, CA (US);

Samuel S. Lightstone, Toronto, CA;

Inventors:

Daniel C. Zilio, Toronto, CA;

Gary G. Valentin, Toronto, CA;

Guy M. Lohman, San Jose, CA (US);

Calisto P. Zuzarte, Pickering, CA;

Roberta J. Cochrane, Los Gatos, CA (US);

Hamid Pirahesh, San Jose, CA (US);

Markos Zaharioudakis, Los Gatos, CA (US);

Kit Man Cheung, Willowdale, CA;

Kevin S. Beyer, San Jose, CA (US);

David E. Simmen, San Jose, CA (US);

Ting Y. Leung, San Jose, CA (US);

Samuel S. Lightstone, Toronto, CA;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention herein provides method and apparatus, including software for determining a set of materialized views or indices of the contents or a subset of the contents of a database in a data processing system to be created for one or more users of the database. The method and apparatus provide method and means for evaluating a workload presented by a user to the database; evaluating the data processing system characteristics; evaluating the database characteristics; and, using the above evaluations for recommending a set of suitable materialized views or indices to the user. Another aspect of the invention, which may be used for a workload presented by a user of a database in a data processing system, provides method and apparatus, including software for determining a set of materialized views or indices of the contents or a subset of the contents of the database, by: generating a plurality of materialized view candidates from evaluation of the workload, data processing system characteristics and database characteristics; estimating statistics for the materialized view candidates such as the number of rows, row size, and column statistics; generating a plurality of potential index candidates by evaluating the workload, data processing system characteristics, database characteristics and the materialized view candidates; and, from the materialized view candidates and index candidates selecting a set of suitable materialized views and/or indices for submission to the user.


Find Patent Forward Citations

Loading…