The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 28, 2006
Filed:
Feb. 15, 2002
Applicants:
Wendell Curtis, Redmond, WA (US);
Karel Zikan, Seattle, WA (US);
Henry Sowizral, Bellevue, WA (US);
Inventors:
Assignee:
Terabeam Corporation, Falls Church, VA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/10 (2006.01);
U.S. Cl.
CPC ...
Abstract
One embodiment of the present invention generates random samples for a Bernoulli distribution. A first covariance matrix is generated using a desired mean vector and a desired covariance matrix of the Bernoulli distribution. A normal vector is constructed using the desired mean vector and the first covariance matrix. A sampling vector is generated using the normal vector and a threshold vector. The sampling vector has the desired mean vector and the desired covariance matrix.