The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 28, 2006
Filed:
Jun. 16, 2004
Jose Marcos Laraia, Pocatello, ID (US);
Masahisa Niwa, Osaka, JP;
Robert P. Moehrke, Chubbuck, ID (US);
Jose G. Taveira, Pocatello, ID (US);
Jose Marcos Laraia, Pocatello, ID (US);
Masahisa Niwa, Osaka, JP;
Robert P. Moehrke, Chubbuck, ID (US);
Jose G. Taveira, Pocatello, ID (US);
AMI Semiconductor, Inc., Pocatello, ID (US);
Matsushita Electric Works, Ltd., Kadoma, JP;
Abstract
Reactive sensors typically exhibit nonlinear response to temperature variation. Systems and methods are disclosed for compensating for the nonlinear and/or temperature dependent behavior of reactive sensors and for calibrating the post-compensation output signals relative to known samples of the physical parameter under measure. One call of embodiments includes a housing containing at least part of a reactive sensor, a monolithic integrated circuit and a timing reference. The integrated circuit includes a waveform generator for generating a sensor exciting signal, a detector for detecting the response of the sensor to the combination of the exciting signal and the under-measure physical parameter, a temperature compensating unit and the Pade Approximant nonlinearity compensating unit are tuned by use of digitally programmed coefficients. The coefficients calibrate the final output as well as compensating for nonlinearity and temperature sensitivity.