The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 2006

Filed:

Dec. 06, 2001
Applicant:

Makoto Hazama, Hyogo, JP;

Inventor:

Makoto Hazama, Hyogo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Waveform shaping by Fourier transformation is performed on data of N points from the head of detected data with a parameter of a previously set peak interval (SS), base sequence is determined as to data of M points (M<N) from the head of the data of N points (S), and a peak interval is obtained from the result of the sequence determination (S). Waveform shaping by Fourier transformation is performed on data of N points from a position returning by L points (L<M) from final data of M points subjected to the sequence determination with a parameter of a precedently obtained peak interval, and thereafter the sequence determination, peak interval calculation and waveform shaping are similarly repeated. Thus, noise can be removed on the basis of Fourier transformation also as to a data section where a migration speed changes, for precisely determining the base sequence.


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