The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 28, 2006
Filed:
May. 25, 2004
Peter M. Osucha, Knoxville, TN (US);
David K. Swindell, Knoxville, TN (US);
Peter M. Osucha, Knoxville, TN (US);
David K. Swindell, Knoxville, TN (US);
Energy Technologies, Inc., Knoxville, TN (US);
Abstract
Methods and apparatus for continuous real-time measurement of bulk material using gamma irradiation and neutron irradiation. A DGA device monitors bulk material flow and produces a spectrum that is compared to a baseline spectrum to produce a relative weight/impurity ratio. A PGNAA device monitors the same bulk material flow and produces a spectrum that is compared to a library of spectrums to produce a relative component ratio. The relative component ratio is processed with the relative weight/impurity ratio to produce an absolute weight and impurity value, which is then processed with the relative component ratio to produce absolute component, or analyte, values.