The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 28, 2006
Filed:
Oct. 05, 2000
Simon Haig Melikian, Westlake, OH (US);
Daren Benedykt Tyminski, Boston, MA (US);
Simon Haig Melikian, Westlake, OH (US);
Daren Benedykt Tyminski, Boston, MA (US);
Coreco Imaging, Inc., Bedford, MA (US);
Abstract
A system and method for pattern identification are disclosed. According to one embodiment of the present invention, the method for locating a pattern includes the steps of (1) providing a pattern image corresponding to the pattern to be located; (2) extracting a pattern contour from the pattern image; (3) generating vector information for the pattern contours, relative to a reference point; (4) creating a reference table for storing the vector information, the reference tables corresponding to the pattern contour; (5) providing a scene image, which will be searched for the pattern; (6) extracting a scene contour from the scene image; (7) generating vector information for the scene contours; and (8) determining whether the pattern has been located within the scene image using the reference table and the vector information for the scene contour. According to another embodiment, a system includes a first image capture device that captures a pattern image which includes an image of a pattern; a second image capture device that captures a scene image to be searched for the pattern; a processor for processing the images, which includes means for extracting at least one pattern contour from the pattern image; means for generating vector information for each of said at least one pattern contours, relative to a reference point; means for creating at least one reference table for storing vector information, each of said at least one reference tables corresponding to at least one pattern contour; means for extracting at least one scene contour from a scene image; means for generating vector information for each of said at least one scene contours; and a means for locating the pattern image within the scene image using the at least one reference tables and the vector information for the at least one scene contours.