The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 28, 2006
Filed:
May. 16, 2003
Applicants:
Christophe J. Dorrer, Matawan, NJ (US);
Inuk Kang, Matawan, NJ (US);
Inventors:
Christophe J. Dorrer, Matawan, NJ (US);
Inuk Kang, Matawan, NJ (US);
Assignee:
Lucent Technologies Inc., Murray Hill, NJ (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method and apparatus for the characterization of an optical pulse includes splitting an optical pulse into two replicas separated by a delay, modulating at least one of the two replicas with a linear temporal phase modulation, measuring a spectrum of the modulated replicas, and characterizing the optical pulse using the measured spectra. In one embodiment of the present invention a spectral phase difference between the replicas is obtained from the measured spectrum using Fourier Transform Spectral Interferometry.