The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 28, 2006
Filed:
Jul. 03, 2003
Shabbir Bambot, Suwanne, GA (US);
Mark L. Faupel, Alphretta, GA (US);
Glenn Steven Arche, Duluth, GA (US);
Shabbir Bambot, Suwanne, GA (US);
Mark L. Faupel, Alphretta, GA (US);
Glenn Steven Arche, Duluth, GA (US);
SpectRx, Inc., Norcross, GA (US);
Abstract
An apparatus and method embodying the invention including utilizing a device with a limited number of interrogation devices to accomplish a large number of measurements on a target tissue. An instrument embodying the invention includes a plurality of detection devices that are arranged in a predetermined pattern on a tissue contacting face of the instrument. The face of the instrument is located adjacent the target tissue, and a plurality of tissue characteristic measurement are simultaneously conducted. The detection devices are moved to a new position, preferably without moving the tissue contacting face, and a second plurality of tissue characteristic measurements are simultaneously conducted. By conducting a series of measurement cycles in this manner, the ultimate resolution of the device is increased, while still obtaining a given resolution, which reduces potential cross-talk errors. Further, a plurality of tissue characteristics are simultaneously obtained from locations spaced across the target tissue during each measurement cycle.