The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 28, 2006
Filed:
Apr. 23, 2002
Roger Franssen, Montzen-Plombieres, BE;
Marc Schyns, Roclenge-sur-Geer, BE;
Hugo Uijtdebroeks, Hasselt, BE;
Roger Franssen, Montzen-Plombieres, BE;
Marc Schyns, Roclenge-sur-Geer, BE;
Hugo Uijtdebroeks, Hasselt, BE;
Centre de Recherches Metallurgiques, A.S.B.L., Brussels, BE;
Abstract
In a process for the inspection of the surface of a cylindrical body and more especially that of a mill roll, at least one zone of the surface is observed by means of an inspection device having an optical axis oriented towards this zone of the surface with a view to determining the state of the surface. To this end, at least one image of the zone supplied by the inspection device is captured, at least one of the images captured is analysed, the analysis of the image or images captured is compared with the analysis of a reference image, the differences between the analysis of the image or images captured and the analysis of the reference image are detected, and at least the orientation of the optical axis is adjusted so as at least to reduce and preferably to eliminate the differences found. The device can include mechanical and/or optical means of adjusting the orientation of the optical axis.