The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 28, 2006
Filed:
Aug. 21, 2001
Francisco Pereira, Pasadena, CA (US);
Darius Modarress, Rancho Palos Verdes, CA (US);
Mory Gharib, San Marino, CA (US);
Dana Dabiri, Altadena, CA (US);
David Jeon, Los Angeles, CA (US);
Francisco Pereira, Pasadena, CA (US);
Darius Modarress, Rancho Palos Verdes, CA (US);
Mory Gharib, San Marino, CA (US);
Dana Dabiri, Altadena, CA (US);
David Jeon, Los Angeles, CA (US);
California Institute of Technology, Pasadena, CA (US);
Abstract
Determining instantaneously the three-dimensional coordinates of large sets of points in space using two or more CCD cameras (or any other type of camera), each with its own lens and pinhole. The CCD's are all arranged so that the pixel arrays are within the same plane. The CCD's are also arranged in a predefined pattern. The combination of the multiple images acquired from the CCD's onto one single image forms a pattern, which is dictated by the predefined arrangement of the CCD's. The size and centroid on the combined image are a direct measure of the depth location Z and in-plane position (X,Y), respectively.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile